Response of electrical film thickness sensors to waves in the liquid film

The electrical liquid film thickness (LFT) sensor developed at ETH Zurich is applied to study wavy annular flows. LFT consists of a matrix electrodes put flush the surface wall which interest present. conductance between transmitter and receiver sampled converted into using calibration function obtained for flat without waves. Due limited lateral resolution non-linear response, waves are characterized with measuring errors, depend on wave height, length angle attack. paper presents result potential field simulations passing over surface. parameters from simulated signals compared input. results used quantify uncertainty dynamic measurements. detailed information response allows better interpretation experimental results.